MET/CAL Procedure ============================================================================= INSTRUMENT: Fluke 6061A Sub5 DATE: 29-Jun-96 AUTHOR: REVISION: ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 81 NUMBER OF LINES: 283 CONFIGURATION: Philips PM 6680 CONFIGURATION: Fluke 5700A CONFIGURATION: HP 8902A ============================================================================= STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON 1.001 ASK- R Q N P U F W 1.002 ASK+ X 1.003 HEAD {* MODULATION TEST º} 1.004 HEAD {} 1.005 HEAD {Internal Modulation Oscillator Frequency test} 1.006 JMP 2.001 1.007 EVAL Dummy 2.001 HEAD MODULATION TEST 2.002 DISP Connect the Hewlett Packard 11722A Sensor Module to the 2.002 DISP UUT RF OUTPUT connector. 2.003 DISP Connect the Hewlett Packard 8902A MODULATION OUTPUT 2.003 DISP (front panel right side) to the Philips PM 6666 2.003 DISP counter input A connector. 2.004 IEEE RC98 2.004 IEEE AP1DB, AM90PC, AI1, MR1 2.005 IEEE [@8902] [TERM LF] 2.005 IEEE [@8902] FR 300MZ 2.005 IEEE [@8902] M1, D9 2.005 IEEE [@8902] [D6000] 2.006 6680 1000H 30U 0.6V +A FA 2W 3.001 IEEE MR0 3.002 6680 400H 12U 0.6V +A FA 2W 4.001 HEAD {} 4.002 HEAD {Internal AM Accuracy Test} 4.003 JMP 5.001 4.004 EVAL Dummy 5.001 HEAD MODULATION TEST 5.002 IEEE [@8902] [I] 5.003 MEMC 90.0pct 5.6U 400H 6.001 IEEE MR0 6.002 IEEE [@8902] [I] 6.003 MEMC 90.0pct 5.6U 1000H 7.001 HEAD {} 7.002 HEAD {AM Accuracy and Distortion Test} 7.003 HEAD {} 7.004 HEAD {Amplitude @ 1dBm} 7.005 JMP 8.001 7.006 EVAL Dummy 8.001 HEAD MODULATION TEST 8.002 DISP Move the Hewlett Packard 8902A MODULATION OUTPUT 8.002 DISP (front panel right side) to the Hewlett Packard 8903E 8.002 DISP Distortion Analyzer INPUT connector. 8.003 DISP Connect the Fluke 5700A OUTPUT to the UUT MOD INPUT 8.003 DISP connector. 8.004 IEEE [@8902] FR 0.4MZ 8.005 IEEE RC98 8.005 IEEE FR0.4MZ, AP1DB, AM30PC, AE1 8.006 5700 0.7071V 1kH S 2W 8.007 IEEE [@8902] [D4000] [I] 8.008 MEMC 30.0pct 3.2U 0.4MH 9.001 IEEE [@8903][TERM LF] 9.001 IEEE [@8903]M3,LN,R0,L2 9.002 IEEE [@8903]RR[I] 9.003 MEMC 0.000pct -1.5U +0U 0.4MH 10.001 IEEE AM70PC 10.002 IEEE [@8902] [I] 10.003 MEMC 70.0pct 4.8U 0.4MH 11.001 IEEE [@8903]RR[I] 11.002 MEMC 0.000pct -3.0U +0U 0.4MH 12.001 IEEE AM90PC 12.002 IEEE [@8902] [I] 12.003 MEMC 90.0pct 5.6U 0.4MH 13.001 IEEE [@8903]RR[I] 13.002 MEMC 0.000pct -5.0U +0U 0.4MH 14.001 HEAD {} 14.002 HEAD {Amplitude @ 7dBm} 14.003 JMP 15.001 14.004 EVAL Dummy 15.001 HEAD MODULATION TEST 15.002 IEEE AP7DB, AM30PC 15.003 IEEE [@8902] [I] 15.004 MEMC 30.0pct 3.2U 0.4MH 16.001 IEEE [@8903]RR[I] 16.002 MEMC 0.000pct -1.5U +0U 0.4MH 17.001 IEEE AM70PC 17.002 IEEE [@8902] [I] 17.003 MEMC 70.0pct 4.8U 0.4MH 18.001 IEEE [@8903]RR[I] 18.002 MEMC 0.000pct -3.0U +0U 0.4MH 19.001 IEEE AM90PC 19.002 IEEE [@8902] [I] 19.003 MEMC 90.0pct 5.6U 0.4MH 20.001 IEEE [@8903]RR[I] 20.002 MEMC 0.000pct -5.0U +0U 0.4MH 21.001 HEAD {} 21.002 HEAD {Amplitude @ 1dBm} 21.003 JMP 22.001 21.004 EVAL Dummy 22.001 HEAD MODULATION TEST 22.002 IEEE [@8902] FR 244.9MZ 22.003 IEEE FR244.9MZ, AP1DB, AM30PC, AE1 22.004 IEEE [@8902] [I] 22.005 MEMC 30.0pct 3.2U 244.9MH 23.001 IEEE [@8903]RR[I] 23.002 MEMC 0.000pct -1.5U +0U 244.9MH 24.001 IEEE AM70PC 24.002 IEEE [@8902] [I] 24.003 MEMC 70.0pct 4.8U 244.9MH 25.001 IEEE [@8903]RR[I] 25.002 MEMC 0.000pct -3.0U +0U 244.9MH 26.001 IEEE AM90PC 26.002 IEEE [@8902] [I] 26.003 MEMC 90.0pct 5.6U 244.9MH 27.001 IEEE [@8903]RR[I] 27.002 MEMC 0.000pct -5.0U +0U 244.9MH 28.001 HEAD {} 28.002 HEAD {Amplitude @ 7dBm} 28.003 JMP 29.001 28.004 EVAL Dummy 29.001 HEAD MODULATION TEST 29.002 IEEE AP7DB, AM30PC 29.003 IEEE [@8902] [I] 29.004 MEMC 30.0pct 3.2U 244.9MH 30.001 IEEE [@8903]RR[I] 30.002 MEMC 0.000pct -1.5U +0U 244.9MH 31.001 IEEE AM70PC 31.002 IEEE [@8902] [I] 31.003 MEMC 70.0pct 4.8U 244.9MH 32.001 IEEE [@8903]RR[I] 32.002 MEMC 0.000pct -3.0U +0U 244.9MH 33.001 IEEE AM90PC 33.002 IEEE [@8902] [I] 33.003 MEMC 90.0pct 5.6U 244.9MH 34.001 IEEE [@8903]RR[I] 34.002 MEMC 0.000pct -5.0U +0U 244.9MH 35.001 HEAD {} 35.002 HEAD {Amplitude @ 1dBm} 35.003 JMP 36.001 35.004 EVAL Dummy 36.001 HEAD MODULATION TEST 36.002 IEEE [@8902] FR 245MZ 36.003 IEEE FR245MZ, AP1DB, AM30PC, AE1 36.004 IEEE [@8902] [I] 36.005 MEMC 30.0pct 3.2U 245MH 37.001 IEEE [@8903]RR[I] 37.002 MEMC 0.000pct -1.5U +0U 245MH 38.001 IEEE AM70PC 38.002 IEEE [@8902] [I] 38.003 MEMC 70.0pct 4.8U 245MH 39.001 IEEE [@8903]RR[I] 39.002 MEMC 0.000pct -3.0U +0U 245MH 40.001 IEEE AM90PC 40.002 IEEE [@8902] [I] 40.003 MEMC 90.0pct 5.6U 245MH 41.001 IEEE [@8903]RR[I] 41.002 MEMC 0.000pct -5.0U +0U 245MH 42.001 HEAD {} 42.002 HEAD {Amplitude @ 7dBm} 42.003 JMP 43.001 42.004 EVAL Dummy 43.001 HEAD MODULATION TEST 43.002 IEEE AP7DB, AM30PC 43.003 IEEE [@8902] [I] 43.004 MEMC 30.0pct 3.2U 245MH 44.001 IEEE [@8903]RR[I] 44.002 MEMC 0.000pct -1.5U +0U 245MH 45.001 IEEE AM70PC 45.002 IEEE [@8902] [I] 45.003 MEMC 70.0pct 4.8U 245MH 46.001 IEEE [@8903]RR[I] 46.002 MEMC 0.000pct -3.0U +0U 245MH 47.001 IEEE AM90PC 47.002 IEEE [@8902] [I] 47.003 MEMC 90.0pct 5.6U 245MH 48.001 IEEE [@8903]RR[I] 48.002 MEMC 0.000pct -5.0U +0U 245MH 49.001 HEAD {} 49.002 HEAD {Amplitude @ 1dBm} 49.003 JMP 50.001 49.004 EVAL Dummy 50.001 HEAD MODULATION TEST 50.002 IEEE [@8902] FR 512MZ 50.003 IEEE FR512MZ, AP1DB, AM30PC, AE1 50.004 IEEE [@8902] [I] 50.005 MEMC 30.0pct 3.2U 512MH 51.001 IEEE [@8903]RR[I] 51.002 MEMC 0.000pct -1.5U +0U 512MH 52.001 IEEE AM70PC 52.002 IEEE [@8902] [I] 52.003 MEMC 70.0pct 4.8U 512MH 53.001 IEEE [@8903]RR[I] 53.002 MEMC 0.000pct -3.0U +0U 512MH 54.001 IEEE AM90PC 54.002 IEEE [@8902] [I] 54.003 MEMC 90.0pct 5.6U 512MH 55.001 IEEE [@8903]RR[I] 55.002 MEMC 0.000pct -5.0U +0U 512MH 56.001 HEAD {} 56.002 HEAD {Amplitude @ 7dBm} 56.003 JMP 57.001 56.004 EVAL Dummy 57.001 HEAD MODULATION TEST 57.002 IEEE AP7DB, AM30PC 57.003 IEEE [@8902] [I] 57.004 MEMC 30.0pct 3.2U 512MH 58.001 IEEE [@8903]RR[I] 58.002 MEMC 0.000pct -1.5U +0U 512MH 59.001 IEEE AM70PC 59.002 IEEE [@8902] [I] 59.003 MEMC 70.0pct 4.8U 512MH 60.001 IEEE [@8903]RR[I] 60.002 MEMC 0.000pct -3.0U +0U 512MH 61.001 IEEE AM90PC 61.002 IEEE [@8902] [I] 61.003 MEMC 90.0pct 5.6U 512MH 62.001 IEEE [@8903]RR[I] 62.002 MEMC 0.000pct -5.0U +0U 512MH 63.001 HEAD {} 63.002 HEAD {Amplitude @ 1dBm} 63.003 JMP 64.001 63.004 EVAL Dummy 64.001 HEAD MODULATION TEST 64.002 IEEE [@8902] FR 1050MZ 64.003 IEEE FR1050MZ, AP1DB, AM30PC, AE1 64.004 IEEE [@8902] [I] [I] 64.005 MEMC 30.0pct 3.2U 1050MH 65.001 IEEE [@8903]RR[I] 65.002 MEMC 0.000pct -1.5U +0U 1050MH 66.001 IEEE AM70PC 66.002 IEEE [@8902] [I] [I] 66.003 MEMC 70.0pct 4.8U 1050MH 67.001 IEEE [@8903]RR[I] 67.002 MEMC 0.000pct -3.0U +0U 1050MH 68.001 IEEE AM90PC 68.002 IEEE [@8902] [I] [I] 68.003 MEMC 90.0pct 5.6U 1050MH 69.001 IEEE [@8903]RR[I] 69.002 MEMC 0.000pct -5.0U +0U 1050MH 70.001 HEAD {} 70.002 HEAD {Amplitude @ 7dBm} 70.003 JMP 71.001 70.004 EVAL Dummy 71.001 HEAD MODULATION TEST 71.002 IEEE AP7DB, AM30PC 71.003 IEEE [@8902] [I] [I] 71.004 MEMC 30.0pct 3.2U 1050MH 72.001 IEEE [@8903]RR[I] 72.002 MEMC 0.000pct -1.5U +0U 1050MH 73.001 IEEE AM70PC 73.002 IEEE [@8902] [I] [I] 73.003 MEMC 70.0pct 4.8U 1050MH 74.001 IEEE [@8903]RR[I] 74.002 MEMC 0.000pct -3.0U +0U 1050MH 75.001 IEEE AM90PC 75.002 IEEE [@8902] [I] [I] 75.003 MEMC 90.0pct 5.6U 1050MH 76.001 IEEE [@8903]RR[I] 76.002 MEMC 0.000pct -5.0U +0U 1050MH 77.001 HEAD {} 77.002 HEAD {Incidental FM Test} 77.003 JMP 78.001 77.004 EVAL Dummy 78.001 HEAD MODULATION TEST 78.002 IEEE RC98 78.003 IEEE FR1050MZ, AP10DB, AM30PC, AI1, MR1 78.004 IEEE [@8902] M2, H2, L1 78.004 IEEE [@8902] [D6000] [I] 78.005 MEMC 0H -300U +0U 1050MHz 79.001 HEAD {} 79.002 HEAD {Residual AM Test} 79.003 JMP 80.001 79.004 EVAL Dummy 80.001 HEAD MODULATION TEST 80.002 IEEE RC98 80.003 IEEE FR100MZ, AP7DB 80.004 IEEE [@8902] FR100MZ, M1, H0, H1, L1 80.004 IEEE [@8902] [D6000] [I] 80.005 MEMC 0.00pct -0.1U +0U 100MH 81.001 END